test pattern generation meaning in Chinese
测试码模式生成
测试图案发生
Examples
- The pseudorandom test pattern generation for bist
基于内建自测试的伪随机测试向量生成方法 - Automatic test pattern generation for multi - clock digital system based on s amp; amp; cct
基于安全充分捕获技术的多时钟数字系统测试矢量生成 - An automatic test pattern generation ( atpg ) algorithm for deliberately selected delay faults is presented to cope with the crosstalk - induced delay effects on longer paths
由于电路中较长的通路具有较短的松弛时间，因此容易因为串扰问题产生时延故障。 - In this way , a simple and direct relation was build up between logical transitions and dynamic current , which makes possible iddt testing pattern generation on logical level
该方法在电路逻辑跳变与电路动态电流之间建立了一种简单直观的关系，使得动态电流测试产生能够在逻辑级上得以实现。 - Based on the analysis and research on fan algorithm , an iddt test pattern generation algorithm for stuck - open faults is present . in the case of ignoring hazards , for the stuck - open faults in cmos circuits , the feasibility of transient current test generation based on fan algorithm is discussed
本文采用启发式搜索的方法，基于对fan算法的分析，在不考虑冒险的情况下对于cmos电路中的开路故障，探讨了利用fan算法进行瞬态电流测试生成的可能性。